6moons Industry Features Nagra 300i P Proformatm 300i cost effective alternative to fully automated wafer inspection systems 76 300 mm wafer diameters high resolution lcd display menu driven for fast, easy setup. Utilizing mti's proprietary non contact capacitance probes, the proforma™ 300i delivers fast, accurate, and reliable measurements for wafer thickness, total thickness variation (ttv), and bow, for wafers up to 300mm in diameter.
6moons Industry Features Nagra 300i P The proforma 300i wafer thickness gage is a capacitance based, differential measurement system that performs non contact thickness measurements of semiconducting and semi insulating wafers. View and download mti proforma 300i user manual online. proforma 300i series measurement for semi conducting, semi insulating, and photo voltaic wafers. proforma 300i measuring instruments pdf manual download. also for: proforma 300gi, proforma 300emi. The proforma 300i wafer metrology system supplied by mti instruments is a manual, non contact measurement system designed to measure wafers up to 300mm in diameter for both thickness and total thickness variation (ttv). the system is portable, fast, precise, reliable, and easy to set up. Proforma 300i utilizes mti’s push pull capacitance technology to accurately and reliably measure semi conducting, semi insulating, and photovoltaic wafers up to 300mm.
6moons Industry Features Nagra 300i P The proforma 300i wafer metrology system supplied by mti instruments is a manual, non contact measurement system designed to measure wafers up to 300mm in diameter for both thickness and total thickness variation (ttv). the system is portable, fast, precise, reliable, and easy to set up. Proforma 300i utilizes mti’s push pull capacitance technology to accurately and reliably measure semi conducting, semi insulating, and photovoltaic wafers up to 300mm. Using mti's proprietary non contact capacitance probes, the proforma 300i is fast, accurate and reliable. the proforma 300i is capable of measuring wafer up to 300mm in diameter for thickness, total thickness variation (ttv) and bow. the oem model consists of the acquisition system and probes only. Features ethernet interface and remote control software. optional calibration wafers available. The proforma 300i wafer thickness gauge is a capacitance based, differential measurement system that performs non contact thickness measurements of semiconducting and semi insulating wafers. By utilizing mti push pull technology, the proforma 300i does not require the wafers to have a consistent electrical ground resulting in exceptional accuracy and repeatability for most wafer types.
Proforma 300isa Youtube Using mti's proprietary non contact capacitance probes, the proforma 300i is fast, accurate and reliable. the proforma 300i is capable of measuring wafer up to 300mm in diameter for thickness, total thickness variation (ttv) and bow. the oem model consists of the acquisition system and probes only. Features ethernet interface and remote control software. optional calibration wafers available. The proforma 300i wafer thickness gauge is a capacitance based, differential measurement system that performs non contact thickness measurements of semiconducting and semi insulating wafers. By utilizing mti push pull technology, the proforma 300i does not require the wafers to have a consistent electrical ground resulting in exceptional accuracy and repeatability for most wafer types.
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