Alat Ukur Ketebalan White Light Interferometer For Non Contact The ims5420 is a high performance white light interferometer for non contact thickness measurement of monocrystalline silicon wafers. the controller has a broadband superluminescent diode (sled) with a wavelength range of 1,100 nm. The ims5420 th white light interferometer opens up new perspectives in industrial thickness measurement of monocrystalline silicon wafers. due to its broadband superluminescent diode (sled), the ims5420 th can be used for undoped, doped and highly doped si wafers.
Micro Epsilon Ims5420 White Light Interferometer For Thickness The interferometer measuring system provides highly accurate measurements of thicknesses for transparent layer materials, e.g. silicon wafers, at a wavelength of 1100 nm. In wafer thickness measurements, the ims5420 th impresses with an excellent price performance ratio. due to the optical transparency of silicon wafers in the wavelength range of 1,100 nm, interferometers can precisely detect their thickness. this enables wafer thickness measurements up to 1.05 mm. View online or download micro epsilon interferometer ims5420 th quick manual. In wafer thickness measurements, the ims5420 th impresses with an excellent price performance ratio. due to the optical transparency of silicon wafers in the wavelength range of 1,100 nm, interferometers can precisely detect their thickness. this enables wafer thickness measurements up to 1.05 mm.
New Interferometer For High Precision Wafer Thickness Measurement View online or download micro epsilon interferometer ims5420 th quick manual. In wafer thickness measurements, the ims5420 th impresses with an excellent price performance ratio. due to the optical transparency of silicon wafers in the wavelength range of 1,100 nm, interferometers can precisely detect their thickness. this enables wafer thickness measurements up to 1.05 mm. The ims5420 interferometer enables the thickness measurement of undoped, doped and highly doped silicon wafers and thus offers a wide range of applications. this wafer thickness measuring system is ideal for the measurement of monocrystalline silicon wafers with a geometric thickness of 500 to 1050 µm and a doping of up to 6 m Ω cm. The ims5420 is a high performance white light interferometer for non contact thickness measurement of monocrystalline silicon wafers. the controller has a broadband superluminescent diode (sled) with a wavelength range of 1,100 nm. In wafer thickness measurements, the ims5420 th impresses with an excellent price performance ratio. due to the optical transparency of silicon wafers, interferometers can precisely detect the thickness in the wavelength range of 1,100 nm. the measurable thickness of air gaps is even up to 4 mm. In wafer thickness measurements, the ims5420 th impresses with an excellent price performance ratio. due to the optical transparency of silicon wafers in the wavelength range of 1,100 nm, interferometers can precisely detect their thickness. this enables wafer thickness measurements up to 1.05 mm.
New Interferometer For High Precision Wafer Thickness Measurement The ims5420 interferometer enables the thickness measurement of undoped, doped and highly doped silicon wafers and thus offers a wide range of applications. this wafer thickness measuring system is ideal for the measurement of monocrystalline silicon wafers with a geometric thickness of 500 to 1050 µm and a doping of up to 6 m Ω cm. The ims5420 is a high performance white light interferometer for non contact thickness measurement of monocrystalline silicon wafers. the controller has a broadband superluminescent diode (sled) with a wavelength range of 1,100 nm. In wafer thickness measurements, the ims5420 th impresses with an excellent price performance ratio. due to the optical transparency of silicon wafers, interferometers can precisely detect the thickness in the wavelength range of 1,100 nm. the measurable thickness of air gaps is even up to 4 mm. In wafer thickness measurements, the ims5420 th impresses with an excellent price performance ratio. due to the optical transparency of silicon wafers in the wavelength range of 1,100 nm, interferometers can precisely detect their thickness. this enables wafer thickness measurements up to 1.05 mm.
New Interferometer For High Precision Wafer Thickness Measurement In wafer thickness measurements, the ims5420 th impresses with an excellent price performance ratio. due to the optical transparency of silicon wafers, interferometers can precisely detect the thickness in the wavelength range of 1,100 nm. the measurable thickness of air gaps is even up to 4 mm. In wafer thickness measurements, the ims5420 th impresses with an excellent price performance ratio. due to the optical transparency of silicon wafers in the wavelength range of 1,100 nm, interferometers can precisely detect their thickness. this enables wafer thickness measurements up to 1.05 mm.
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